AFM/Raman is a synergistic tool that can simultaneously determine a sample’s topography (atomic force microscopy) and chemical signature (Raman spectrum). In atomic force microscopy, a small, sharp ...

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The inherent modularity of the alpha300 R makes it possible to integrate Raman imaging with complementary imaging methods such as AFM, SNOM and SEM, and lets it evolve with changing experimental ...

WITec’s AFMs are designed and built to be combined with other imaging methods such as confocal Raman imaging and Scanning Near-field ... Other microscopy methods that can be incorporated with the AFM ...

One of the most important acronyms in nanotechnology is AFM – Atomic Force Microscopy. This instrument has become the most widely used tool for imaging, measuring and manipulating matter at the ...

The ultrasonic waves cause the sample to vibrate, and the AFM tip detects these vibrations as it scans across ... The integration of AFAM with other complementary techniques, such as Raman ...

The alpha300 R series' inherent modularity makes it possible to combine Raman imaging with complementary imaging methods including AFM, SNOM and SEM, and allows it to evolve with changing experimental ...