the growth of an amorphous oxide layer, and damage caused by the foregoing traditional mechanical preparation methods. Broad Ion Beam (BIB) milling is a highly effective SEM sample preparation ...

75.5cm2/V/s mobility and high stability are claimed for amorphous oxide semiconductor thin-film transistors created at the Ningbo Institute of Materials Technology and Engineering (NIMTE). The ...

Oxide feedstock particles are first jar-milled to produce amorphous feedstock particles with submicron ... such as cross-sectional and energy dispersive X-ray spectroscopy (EDS) SEM images (Shown ...

After cleaning with the Solarus II system, amorphous surface damage and crosslinking are eliminated. Protocol: hydrogen and oxygen; duration: 5 min; sample: a semiconductor device; SEM image.

A study in Nature Communications introduces amorphous organic-hybrid vanadium oxide (AOH-VO ... scanning electron microscopy (SEM), and X-ray absorption spectroscopy (XAS). In-situ XRD and ...