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Equipment list: Scanning Electron Microscope (SEM) and Electron Probe Microanalyzer (EPMA) Laboratory
FE-EPMA (JEOL JXA-iHP200F) FE-SEM (JEOL JSM 7100FT) WSEM (JEOL JSM 6010LA) Leica EM ACE600 sputter coater EMS 150T sputter coater ...
AZoM on MSN12d
Characterizing Earth Materials with Deep-Learning-Enhanced Electron Microscopy
A new deep learning method called DLE-EM accelerates SEM imaging of geological materials by up to 16×, enabling large-scale, ...