XPS imaging is used to determine the lateral distribution of either chemistry or elements at the surface. Rapid and high-spatial-resolution parallel images are acquired by the AXIS Supra + instrument.

Overview. The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, ...

This article discusses how to determine the surface area of battery anode and ... Optimizing the efficiency of the batteries requires accurate characterization of the materials used ... be measured.

The XPS lab is part of the Surface Analysis Core, one of the ten research cores integrated within the MRL Facilities. At MRL, ...

The HR-XPS in our lab is equipped with a twin anode (Al K α at 1486.6 or Ag L α at 2984.3 eV) FOCUS 500 monochromator and a SPECS hemispherical analyzer from the PHOIBOS series. The Al monochromator ...