X-ray photoelectron spectroscopy (XPS) is a powerful technique widely used for the surface analysis of materials. At low energy resolution it provides qualitative and quantitative information on the ...

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Fast XPS imaging with high spatial resolution exposes the lateral distribution of surface chemistry and helps in additional characterization by selected area analysis. The AXIS Supra + provides ...

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XPS relies on the photoelectric effect, where irradiating a material with X-rays causes the emission of core electrons. The kinetic energy of these emitted electrons is measured, which can be directly ...

is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including elemental mapping capabilities, an electron gun source for ...

This makes AES excellent for high-resolution imaging and pinpoint analysis of surface features. Conversely, XPS involves irradiating the sample with X-rays to eject core electrons, with the emitted ...

The three main characterisation techniques of the facility are: NanoESCA II Photoemission Electron Microscope (PEEM), high-resolution X-ray Photoelectron Spectroscopy (XPS) and Spot Profile Analysis ...