Using a STEM-in-SEM conversion holder, we can convert a scanning electron microscope into a scanning transmission microscope.

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: ...

Researchers have demonstrated that by using a semiconductor with flexible bonds, the material can be molded into various ...

for operating all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning electron microscopes (FIB-SEMs). ZEN stands for ZEISS Efficient Navigation and lets microscopists ...

Earlier this year, scientists discovered a peculiar term appearing in published papers: "vegetative electron microscopy".

Linköping University researchers achieve a tenfold performance boost in conductive polymer metasurfaces, advancing the field ...

An optical breakthrough in plastic metalenses designed to offer ultrafine control of light could enable realistic holograms ...