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This research team succeeded in imaging and quantifying ionic migration/diffusion at individual grain boundaries within a solid electrolyte using secondary ion mass spectrometry (SIMS).
Recent research has focused on improving the accuracy and reliability of depth profiling methods, such as Auger Electron Spectroscopy (AES), Secondary Ion Mass Spectroscopy (SIMS), and Glow ...
The team used three-dimensional molecular imaging techniques enabled by secondary ion mass spectrometry and nanogram-level ...