The system can measure all wafer materials including Gallium-Arsenide, Silicon and Indium-Phosphide, without recalibration. While we only use edited and approved content for Azthena answers, it may on ...

The F40 configuration is typically determined for a specific film thickness range, from the F40-UV for measuring films as thin as 4nm, to the F40-XT measuring films up to 350µm thick. The F40 may be ...

The plates can be positioned utilizing AutoThickness, where the instrument moves automatically to make contact with the sample, or to a user-defined thickness. Four optical encoders, one at each ...