XPS has been used for decades to examine surface composition and chemistry. But lesser-known approaches can reveal a range of ...

The X-ray photoelectron spectra of Si 2p, C 1s, N 1s and O 1s signals of seven commercial Si 3 N 4 powders, produced by different processes as shown in Table 1, were measured using XPS instrument.

Resonant Raman scattering incubic and hexagonal boron nitride. Physical Review B, 71(20), 205201. This information has been sourced, reviewed and adapted from materials provided by Thermo Fisher ...

To characterize the cubic boron nitride nanodot samples, the Researchers used a combination of Raman Spectroscopy (HORIBA LabRam), scanning electron microscopy (SEM, XL30-FEG), atomic force microscopy ...

New research shows that X-ray photoelectron spectroscopy (XPS) can give misleading analysis results due to an erroneous assumption during calibration. X-ray photoelectron spectroscopy (XPS ...

X-ray Photoelectron Spectroscopy (XPS)is a highly sensitive technique for identifying and quantifying the chemical states of elements on the outermost surface of a solid. It is especially useful for ...