The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including ...

X-ray photoelectron spectroscopy (XPS) is widely used for characterizing the uppermost 10 nm of a materials surface. Also called electron spectroscopy for chemical analysis (ESCA), the analytical ...

X-ray photoelectron spectroscopy (XPS) is a powerful technique widely used for the surface analysis of materials. At low energy resolution it provides qualitative and quantitative information on the ...

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