News

Electronic Design3h
Using Design-to-Test Workflows and Managing the IP Lifecycle in Chiplet Designs
In his Chiplet Summit keynote, Nilesh Kamdar, General Manager at Keysight EDA, addresses chiplet test and lifecycle management.
PV Tech7h
Record 83% module test failure in Kiwa PVEL’s 2025 Module Reliability Scorecard
A total of 83% of module manufacturers have had at least one test failure in the Kiwa PVEL 2025 Module Reliability Scorecard.
Solar Power World5h
83% of module manufacturers had one test failure in latest Kiwa PVEL scorecard
Testing lab Kiwa PVEL has published its 11th annual PV Module Reliability Scorecard. This digital resource provides solar ...